Exploration towards electrostatic integrity for SiGe on insulator (SG-OI) on junctionless channel transistor (JLCT)

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ژورنال

عنوان ژورنال: Facta universitatis - series: Electronics and Energetics

سال: 2017

ISSN: 0353-3670,2217-5997

DOI: 10.2298/fuee1703383v